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Transmission through thin layers. In Fig. 35-43, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) Part of the light ends up in material 3 as ray r3(the light does not reflect inside material 2) and r4(the light reflects twice inside material 2). The waves of r3and r4interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-3 refers to the indexes of refraction n1,n2and n3, the type of interference, the thin-layer thickness L in nanometers, and the wavelength in nanometers of the light as measured in air. Where λis missing, give the wavelength that is in the visible range. Where Lis missing, give the second least thickness or the third least thickness as indicated.

Short Answer

Expert verified

The wavelength with maximum intensity of transmitted light is 528nm.

Step by step solution

01

Given Data:

  • The refractive index of first medium isn1=1.68.
  • The refractive index of the thin film isn2=1.59.
  • The refractive index of the third mediumn3=1.50.
  • The thickness of the layer is L=415nm.
02

Interference of light through thin films:

Light that is incident normally on thin films is reflected from both the front and back surfaces, causing interference of the reflected light. When constructive interference happens, it produces bright reflected light, and when entirely destructive interference occurs, it produces a dark region.

03

Determine the wavelength:

The interference of the transmitted rays is similar to the interference of the reflection of light. Here in this case, as n1>n2and n2>n3 the two transmitted rays are 180∘out of phase.

Therefore, the condition for constructive interference is,

role="math" localid="1663086917743" 2L=m+12λmaxn2λmax=4Ln22m+1

Calculating the wavelength for first few orders number as follow.

For:m=0

role="math" localid="1663087061171" λ1=4415nm1.5920+1=2639nm

For : m=1

role="math" localid="1663087077254" λ2=4415nm1.5921+1=880nm

For :m=2

role="math" localid="1663087102840" λ3=4415nm1.5922+1=528nm

As 528nmlies in visible range, hence the wavelength with maximum intensity of transmitted light is528nm.

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Most popular questions from this chapter

In a phasor diagram for any point on the viewing screen for the two slit experiment in Fig 35-10, the resultant wave phasor rotates60.0°in 2.50×10-16 s. What is the wavelength?

Transmission through thin layers. In Fig. 35-43, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) Part of the light ends up in material 3 as ray r3(the light does not reflect inside material 2) and r4(the light reflects twice inside material 2). The waves of r3andr4interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-3 refers to the indexes of refractionn1,n2andn3the type of interference, the thin-layer thicknessLin nanometers, and the wavelengthλin nanometers of the light as measured in air. Whereλis missing, give the wavelength that is in the visible range. WhereLis missing, give the second least thickness or the third least thickness as indicated.

In a double-slit experiment, the fourth-order maximum for a wavelength of 450 nm occurs at an angle of θ=90°. (a) What range of wavelengths in the visible range (400 nm to 700 nm) are not present in the third-order maxima? To eliminate all visible light in the fourth-order maximum, (b) should the slit separation be increased or decreased and (c) what least change is needed?

Figure 35-24a gives intensity lversus position x on the viewing screen for the central portion of a two-slit interference pattern. The other parts of the figure give phasor diagrams for the electric field components of the waves arriving at the screen from the two slits (as in Fig. 35-13a).Which numbered points on the screen bestcorrespond to which phasor diagram?

(a) Figure 1

(b) Figure 2

(c) Figure 3

(d) Figure 4

Reflection by thin layers. In Fig. 35-42, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) The waves of rays r1and r2interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35- 2 refers to the indexes of refraction n1, n2andn3, the type of interference, the thin-layer thickness Lin nanometres, and the wavelength λin nanometres of the light as measured in air. Where λis missing, give the wavelength that is in the visible range. Where Lis missing, give the second least thickness or the third least thickness as indicated.

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