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Reflection by thin layers. In Fig. 35-42, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) The waves of rays r1and r2 interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35- 2 refers to the indexes of refraction n1, localid="1663139751503" n2and n3, the type of interference, the thin-layer thickness Lin nanometres, and the wavelength λin nanometres of the light as measured in air. Where λis missing, give the wavelength that is in the visible range. Where Lis missing, give the second least thickness or the third least thickness as indicated.

Short Answer

Expert verified

The thickness of the thin layer is 161nm.

Step by step solution

01

Given Data

  • The refractive index of first medium is n1=1.68.
  • The refractive index of the thin film isn2=1.59
  • The refractive index of the third medium n3=1.50
  • The minimum intensity occurs at wavelength λ=342nm.
02

Interference in thin films

Bright colours reflected from thin oil on water and soap bubbles are a consequence of light interference. Due to the constructive interference of light reflected from the front and back surfaces of the thin film, these bright colours can be seen. For a perpendicular incident beam, the maximum intensity of light from the thin film satisfies the condition:

2L=m+12λn2m=0,1,2,...(Maxima—brightfilmintheair)

where λis the wavelength of the light in air, L is its thickness, and n2 is the film’s refractive index.

03

Determining the 2nd least thickness for this arrangement of materials.

Here, in this case, light travels in medium with n1=1.68and incident on the film whose refractive index is n2=1.59And then, the light gets reflected of the third surface n3=1.50while travelling through the film. A minimum intensity is observed at λ=342nmand thickness of the film is to be determined at 2nd order of intensity which m=1in this case. As a result, the condition for destructive interference or minimum intensity is

2L=m+12λ342n2 (Destructive)

The 2nd least thickness is

2L=1+12342nm1.59L=3342nm41.59=161nm

Hence the thickness of the thin layer is 161nm.

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Most popular questions from this chapter

In Fig. 35-39, two isotropic point sources S1 and S2 emit light in phase at wavelength λ and at the same amplitude. The sources are separated by distance 2d=6λ. They lie on an axis that is parallel to an x axis, which runs along a viewing screen at distance D=20.0λ. The origin lies on the perpendicular bisector between the sources. The figure shows two rays reaching point P on the screen, at positionxP. (a) At what value of xPdo the rays have the minimum possible phase difference? (b) What multiple ofλ gives that minimum phase difference? (c) At what value ofxPdo the rays have the maximum possible phase difference? What multiple of λ gives (d) that maximum phase difference and (e) the phase difference when xP=6λ ? (f) When xP=6λ, is the resulting intensity at point P maximum, minimum, intermediate but closer to maximum, or intermediate but closer to minimum?

Three electromagnetic waves travel through a certain point P along an x-axis. They are polarized parallel to a y-axis, with the following variations in their amplitudes. Find their resultant at P.

E1=(10.00μ³Õ/m)sin[2×1014t]E2=(5.00μ³Õ/m)sin[2×1014t+45°]E3=(5.00μ³Õ/m)sin[2×1014t-45°]

Figure 35-25 shows two sources s1 and s2 that emit radio waves of wavelengthλin all directions. The sources are exactly in phase and are separated by a distance equal to 1.5λ . The vertical broken line is the perpendicular bisector of the distance between the sources.

(a) If we start at the indicated start point and travel along path 1, does the interference produce a maximum all along the path, a minimum all along the path, or alternating maxima and minima? Repeat for

(b) path 2 (along an axis through the sources) and

(c) path 3 (along a perpendicular to that axis).

57 through 68 64, 65 59 Transmission through thin layers.

In Fig. 35-43, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) Part of the light ends up in material 3 as ray r3 (the light does not reflect inside material 2) and r4(the light reflects twice inside material 2). The waves of r3 and r4interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-3 refers to the indexes of refraction n1,n2andn3, the type.

Of interference, the thin-layer thickness L in nanometres, and the wavelength λ in nanometres of the light as measured in air.

Where λ is missing, give the wavelength that is in the visible range.

Where L is missing, give the second least thickness or the third least thickness as indicated?

In Fig. 35-4, assume that two waves of light in air, of wavelength 400nm, are initially in phase. One travels through a glass layer of index of refraction n1=1.60and thickness L. The other travels through an equally thick plastic layer of index of refraction n2=1.50. (a) What is the smallest value Lshould have if the waves are to end up with a phase difference of 5.65 rad? (b) If the waves arrive at some common point with the same amplitude, is their interference fully constructive, fully destructive, intermediate but closer to fully constructive, or intermediate but closer to fully destructive?

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