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Scanning electron microscopy uses a beam of electrons to scan a sample in a raster-like pattern to produce high-resolution 3 D images of samples.

Scanning electron microscopy (SEM) uses a beam of electrons that pass through electromagnetic fields and lenses that focus the beam on the sample. Once the electron beam hits the sample, X-rays, backscattered electrons, and secondary electrons are produced. These are collected by the detectors that convert them into a signal to produce the 3 D image. The X-rays provide information on the elemental composition of the sample. The chemical composition in different areas of the sample is obtained from backscattered electrons. The surface structure and topography are provided by the secondary electrons. Hence, SEM is useful in analyzing the cell surface structure and composition.