/*! This file is auto-generated */ .wp-block-button__link{color:#fff;background-color:#32373c;border-radius:9999px;box-shadow:none;text-decoration:none;padding:calc(.667em + 2px) calc(1.333em + 2px);font-size:1.125em}.wp-block-file__button{background:#32373c;color:#fff;text-decoration:none} Problem 19 Consider silicon doped at impuri... [FREE SOLUTION] | 91Ó°ÊÓ

91Ó°ÊÓ

Consider silicon doped at impurity concentrations of \(N_{d}=2 \times 10^{16} \mathrm{~cm}^{-3}\) and \(N_{a}=0 .\) An empirical expression relating electron drift velocity to electric field is given by $$ v_{d}=\frac{\mu_{n 0} \mathrm{E}}{\sqrt{1+\left(\frac{\mu_{n 0} \mathrm{E}}{v_{\mathrm{sut}}}\right)^{2}}} $$ where \(\mu_{n 0}=1350 \mathrm{~cm}^{2} / \mathrm{V}-\mathrm{s}, v_{\text {sat }}=1.8 \times 10^{7} \mathrm{~cm} / \mathrm{s}\), and \(\mathrm{E}\) is given in \(\mathrm{V} / \mathrm{cm} .\) Plot electron drift current density (magnitude) versus electric field (log-log scale) over the range \(0 \leq \mathrm{E} \leq 10^{6} \mathrm{~V} / \mathrm{cm}\)

Short Answer

Expert verified
Compute drift velocity, determine current density, and plot the results on a log-log scale.

Step by step solution

01

Understanding the Problem

We are asked to plot the electron drift current density with respect to varying electric fields using given parameters. The drift velocity equation involves empirical data relating velocity to the electric field. Given that only one impurity concentration is specified, we assume an n-type semiconductor.
02

Calculate Electron Concentration

Since the silicon is doped n-type with donor concentration \(N_d = 2 \times 10^{16} \text{ cm}^{-3}\) and \(N_a = 0\), the electron concentration \(n = N_d\) under the assumption of full ionization and negligible intrinsic carrier concentration compared to extrinsic doping.
03

Understand Given Empirical Formula

The drift velocity \(v_d\) is calculated using \(v_d = \frac{\mu_{n0} E}{\sqrt{1+\left(\frac{\mu_{n0} E}{v_{\text{sat}}}\right)^2}}\). Here, \(\mu_{n0} = 1350 \text{ cm}^2/\text{V-s}\) is the electron mobility and \(v_{\text{sat}} = 1.8 \times 10^7 \text{ cm/s}\) is the saturation velocity, \(E\) is the electric field.
04

Calculate Drift Velocity for Each Field Value

For each value of electric field \(E\), compute the drift velocity \(v_d\) using the given empirical formula.
05

Determine Current Density

The drift current density \(J_d\) is given by \(J_d = q \cdot n \cdot v_d\), where \(q = 1.6 \times 10^{-19} \text{ C}\) is the elementary charge. By using \(n = N_d\) calculated earlier, compute \(J_d\) for each corresponding \(v_d\).
06

Plotting the Results

With the calculated values of \(J_d\) for different \(E\) conditions, plot \(J_d\) versus \(E\) on a log-log scale to visualize the relationship over the given range \(0 \leq E \leq 10^6 \text{ V/cm}\). A log-log plot allows easy identification of power-law behaviors.

Unlock Step-by-Step Solutions & Ace Your Exams!

  • Full Textbook Solutions

    Get detailed explanations and key concepts

  • Unlimited Al creation

    Al flashcards, explanations, exams and more...

  • Ads-free access

    To over 500 millions flashcards

  • Money-back guarantee

    We refund you if you fail your exam.

Over 30 million students worldwide already upgrade their learning with 91Ó°ÊÓ!

Key Concepts

These are the key concepts you need to understand to accurately answer the question.

N-type Semiconductor
In the context of semiconductors, an n-type semiconductor is a material that has been doped with impurities to increase the number of conduction electrons in its structure. This process involves adding donor atoms, which have extra electrons that are freed up to contribute to electrical conduction.
This makes n-type semiconductors more conductive than the pure, or intrinsic, forms of the material such as silicon. In this exercise, the semiconductor is silicon, doped with a donor concentration of \(N_d = 2 \times 10^{16} \, \text{cm}^{-3}\).
These donor atoms donate additional electrons, making the number of mobile charge carriers equal to the donor concentration, assuming full ionization and negligible intrinsic carriers. As a result, the concentration of electrons \(n\) is essentially equal to \(N_d\). This high electron concentration is what characterizes an n-type semiconductor.
  • The process involves "doping," which adds impurities.
  • N-type means adding donor atoms with extra electrons.
  • The goal is to enhance electrical conductivity.
Empirical Formula
Empirical formulas are crucial in expressing the dependences and relationships in scientific measurements. In this exercise, we are given an empirical formula relating electron drift velocity \(v_d\) to the electric field \(E\).
The formula is given by:
\[ v_d = \frac{\mu_{n 0} \cdot E}{\sqrt{1 + \left(\frac{\mu_{n 0} \cdot E}{v_{\text{sat}}}\right)^2}} \]
This formula is derived from empirical observations and is used to model the behavior of electrons moving through a semiconductor under an electric field. It includes parameters like electron mobility \(\mu_{n0}\) and saturation velocity \(v_{\text{sat}}\).
Understanding these parameters is key:
  • Electron mobility \(\mu_{n0}\), usually in cm\(^2\)/V-s, dictates how quickly an electron can move through the material under an electric field.
  • Saturation velocity \(v_{\text{sat}}\) represents the maximum speed electrons can attain in the semiconductor.
By plugging the values of \(E\) into this formula, one can calculate the drift velocity \(v_d\). This allows for understanding of how \(E\) influences \(v_d\) rapidly, and how this relationship applies to various electronic applications.
Electric Field
An electric field is a physical field produced by electrically charged objects. It is the force field surrounding these charges, affecting other charges within that field. In the context of semiconductors, and this particular exercise, the electric field \(E\) is applied to the material and influences the motion of electrons.
The strength and direction of the electric field affect how fast and in what direction the electrons drift. In practical semiconductor applications, such fields are essential to control the flow of electrons and, consequently, the overall current in the device.
Electric fields are measured in volts per centimeter (V/cm). For instance, in this example, the electric field \(E\) is varied between 0 and \(10^6 \, \text{V/cm}\) to observe its impact on electron drift velocity and current density. The applied electric field is the driver that pushes electrons from one end of the semiconductor to the other.
  • Electric fields influence the motion of charged particles.
  • They are central to controlling electron flow in semiconductors.
  • Measured in volts per centimeter (V/cm).
Drift Current Density
Drift current density is a measure of the movement of charge carriers in a semiconductor due to an applied electric field. It indicates how much electric charge passes through a unit area of the material per unit time. In this exercise, the drift current density, \(J_d\), reflects how the electrons, as charge carriers, respond to the electric field \(E\).
The drift current density can be calculated using the formula:
\[ J_d = q \, \cdot \, n \, \cdot \, v_d \]
where:
  • \(q\) is the elementary charge (\(1.6 \times 10^{-19} \, \text{C}\)).
  • \(n\) is the concentration of electrons, which is determined by the donor concentration \(N_d\) in an n-type semiconductor.
  • \(v_d\) is the drift velocity, calculated using the given empirical formula.
This formula shows that current density is directly proportional to the electron concentration and the drift velocity. By calculating \(J_d\) for various electric field values, and plotting these on a log-log scale, one can analyze how the strength of the electric field impacts electron transport in n-type semiconductors, offering insights into semiconductor device performance.

One App. One Place for Learning.

All the tools & learning materials you need for study success - in one app.

Get started for free

Most popular questions from this chapter

The concentration of holes in a semiconductor is given by \(p(x)=5 \times 10^{15} e^{-x / L_{p}} \mathrm{~cm}^{-3}\) for \(x \geqslant 0 .\) Determine the hole diffusion current density at \((a) x=0\) and \((b) x=L_{p}\) if the material is \((i)\) silicon with \(D_{p}=10 \mathrm{~cm}^{2} / \mathrm{s}\) and \(L_{p}=50 \mu \mathrm{m}\), and \((i i)\) germanium with \(D_{p}=48 \mathrm{~cm}^{2} / \mathrm{s}\) and \(L_{p}=22.5 \mu \mathrm{m}\).

Germanium is doped with \(5 \times 10^{15}\) donor atoms per \(\mathrm{cm}^{3}\) at \(T=300 \mathrm{~K}\). The dimensions of the Hall device are \(d=5 \times 10^{-3} \mathrm{~cm}, W=2 \times 10^{-2} \mathrm{~cm}\), and \(L=10^{-1} \mathrm{~cm} .\) The current is \(I_{x}=250 \mu A\), the applied voltage is \(V_{x}=100 \mathrm{mV}\), and the magnetic flux density is \(B_{z}=500\) gauss \(=5 \times 10^{-2}\) tesla. Calculate: ( \(a\) ) the Hall voltage, \((b)\) the Hall field, and ( \(c\) ) the carrier mobility.

Another technique for determining the conductivity type of a semiconductor is called the hot probe method. It consists of two probes and an ammeter that indicates the direction of current. One probe is heated and the other is at room temperature. No voltage is applied, but a current will exist when the probes touch the semiconductor. Explain the operation of this hot probe technique and sketch a diagram indicating the direction of current for p- and n-type semiconductor samples.

In GaAs, the donor impurity concentration varies as \(N_{d 0} \exp (-x / L)\) for \(0 \leq x \leq L\), where \(L=0.1 \mu \mathrm{m}\) and \(N_{d 0}=5 \times 10^{16} \mathrm{~cm}^{-3}\). Assume \(\mu_{n}=6000 \mathrm{~cm}^{2} / \mathrm{V}\) -s and \(T=300 \mathrm{~K}\). (a) Derive the expression for the electron diffusion current density versus distance over the given range of \(x\). \((b)\) Determine the induced electric field that generates a drift current density that compensates the diffusion current density

The total current in a semiconductor is constant and equal to \(J=-10 \mathrm{~A} / \mathrm{cm}^{2}\). The total current is composed of a hole drift current and electron diffusion current. Assume that the hole concentration is a constant and equal to \(10^{16} \mathrm{~cm}^{-3}\) and assume that the electron concentration is given by \(n(x)=2 \times 10^{15} e^{-x / L} \mathrm{~cm}^{-3}\) where \(L=15 \mu \mathrm{m}\). The electron diffusion coefficient is \(D_{n}=27 \mathrm{~cm}^{2} / \mathrm{s}\) and the hole mobility is \(\mu_{p}=420 \mathrm{~cm}^{2} / \mathrm{V}-\mathrm{s}\). Calculate ( \(a\) ) the electron diffusion current density for \(x>0,(b)\) the hole drift current density for \(x>0\), and \((c)\) the required electric field for \(x>0 .\)

See all solutions

Recommended explanations on Physics Textbooks

View all explanations

What do you think about this solution?

We value your feedback to improve our textbook solutions.

Study anywhere. Anytime. Across all devices.