The pull strength of a wire-bonded lead for an integrated circuit is
monitored. The following table provides data for 20 samples each of size 3.
$$ \begin{array}{cccc} \text { Sample Number } & x_{1} & x_{2} & x_{3} \\ 1 &
15.4 & 15.6 & 15.3 \\ 2 & 15.4 & 17.1 & 15.2 \\ 3 & 16.1 & 16.1 & 13.5 \\ 4
& 13.5 & 12.5 & 10.2 \\ 5 & 18.3 & 16.1 & 17.0 \\ 6 & 19.2 & 17.2 & 19.4 \\\
7 & 14.1 & 12.4 & 11.7 \\ 8 & 15.6 & 13.3 & 13.6 \\ 9 & 13.9 & 14.9 & 15.5
\\\ 10 & 18.7 & 21.2 & 20.1 \\ 11 & 15.3 & 13.1 & 13.7 \\ 12 & 16.6 & 18.0 &
18.0 \\ 13 & 17.0 & 15.2 & 18.1 \\ 14 & 16.3 & 16.5 & 17.7 \\ 15 & 8.4 &
7.7 & 8.4 \\ 16 & 11.1 & 13.8 & 11.9 \\ 17 & 16.5 & 17.1 & 18.5 \\ 18 &
18.0 & 14.1 & 15.9 \\ 19 & 17.8 & 17.3 & 12.0 \\\20 & 11.5 & 10.8 & 11.2
\end{array} $$a. Use all the data to determine trial control limits for
\(\bar{X}\) and
\(R\) charts, construct the control limits, and plot the data.
b. Use the control limits from part (a) to identify outof-control points. If
necessary, revise your control limits assuming that any samples that plot
outside of the control limits can be eliminated.
c. Repeat parts (a) and (b) for \(\bar{X}\) and \(S\) charts.