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The following represent the number of solder defects observed on 24 samples of five printed circuit boards: \(7,6,8,10,\) 24,6,5,4,8,11,15,8,4,16,11,12,8,6,5,9,7,14,8,21 (a) Using all the data, compute trial control limits for a \(U\) control chart, construct the chart, and plot the data. (b) Can we conclude that the process is in control using a \(U\) chart? If not, assume that assignable causes can be found, and list points and revise the control limits.

Short Answer

Expert verified
The U control chart shows some points outside the control limits, indicating the process is not in control.

Step by step solution

01

Calculate the Average Number of Defects per Unit

Given the data set of solder defects, the total observed defects are sum of the values: \[ 7+6+8+10+24+6+5+4+8+11+15+8+4+16+11+12+8+6+5+9+7+14+8+21 = 229 \] Each sample consists of 5 printed circuit boards and we have 24 samples, so the total number of units (boards) is \( 24 \times 5 = 120 \). The average number of defects per unit \( \bar{u} \) is given by: \[ \bar{u} = \frac{229}{120} \approx 1.9083 \]
02

Establish Trial Control Limits for the U Control Chart

Using the average defect rate \( \bar{u} \), the control limits for a \( U \) control chart can be calculated using:- Upper Control Limit (UCL): \[ UCL = \bar{u} + 3 \sqrt{\frac{\bar{u}}{n}} \]- Lower Control Limit (LCL): \[ LCL = \bar{u} - 3 \sqrt{\frac{\bar{u}}{n}} \]Where \( n = 5 \) is the number of boards per sample.Calculate UCL:\[ UCL = 1.9083 + 3 \sqrt{\frac{1.9083}{5}} \approx 1.9083 + 3 \times 0.6179 \approx 3.762 \]Calculate LCL:\[ LCL = 1.9083 - 3 \sqrt{\frac{1.9083}{5}} \approx 1.9083 - 3 \times 0.6179 \approx 0.055 \]Since the LCL cannot be negative when dealing with defect counts, we set LCL to 0.
03

Construct the U Control Chart and Plot Data

Plot each sample's defect rate using the formula \( u_i = \frac{x_i}{n} \), where \( x_i \) is the number of defects in each sample.For example, the first data point is:\[ u_1 = \frac{7}{5} = 1.4 \]Complete this for all samples, plot \( u_i \) on the \( y \)-axis, against the sample number on the \( x \)-axis. Draw the UCL at 3.762 and LCL at 0 (average line at 1.9083).
04

Analyze the Control Chart

On examining the chart, check if any points lie outside the UCL or LCL. Points outside these limits suggest out-of-control conditions. Second, check for non-random patterns within the control limits, which can also indicate out-of-control processes.
05

Conclusion on Process Control

If any points fall outside the control limits or indicate a non-random pattern, the process is not in control, and these points need investigating for assignable causes. In case such anomalies exist, revise control limits without these outliers and repeat the process to create a stable control chart.

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Key Concepts

These are the key concepts you need to understand to accurately answer the question.

Control Limits
Control limits play a crucial role in a U control chart. They serve as boundaries indicating the expected range of process variation. These limits help us determine if the process is stable and in control. For a U control chart, we have the Upper Control Limit (UCL) and the Lower Control Limit (LCL).

- **Upper Control Limit (UCL):** This is found by adding three times the standard deviation of the defect rate to the average defect rate. - **Lower Control Limit (LCL):** It is calculated by subtracting three times the standard deviation from the average defect rate. However, if calculated LCL is negative, it is set to zero since negative defect counts are not possible.

These control limits help visualize and assess whether the observed variations in the process are due to common, natural variations, or if they result from specific, assignable causes.
Defect Rate
The defect rate in a process is an essential metric when constructing a U control chart. It represents the proportion of defective items or issues within each group of units investigated. Essentially, it allows us to assess quality consistency.

- The defect rate is symbolized by the variable \( u_i \), where \( u \) denotes the number of defects per unit.- Calculating the defect rate is straightforward: divide the number of observed defects in a sample by the number of units within that sample.- Monitoring defect rates over time helps in detecting trends or shifts, indicating the quality's average behavior.

Consistently calculating and plotting the defect rates allows businesses to maintain control over their processes and identify any problem areas early on.
Average Number of Defects per Unit
The average number of defects per unit, often represented as \( \bar{u} \), gives us a baseline measure of defect occurrences in a process. This metric is fundamental for calculating control limits in a U control chart.

- To find the average number of defects per unit, sum up all the defects from all samples and divide by the total units. Here, since each sample contains 5 units and there are 24 samples, \( \bar{u} \) is computed as \( \frac{229}{120} \approx 1.9083 \).- This value is used to compute both the UCL and LCL, acting as the central line in the control chart.

Understanding this average helps in diagnosing general trends and can signal potential issues if deviations occur frequently across different sampling periods.
Out-of-Control Conditions
Out-of-control conditions are critical to identify and address in quality control processes. They signify that the process variability is outside expected limits, possibly due to assignable causes.

- A process is considered out-of-control if points on the U control chart fall outside of the established control limits. - Besides boundary breaches, looking for non-random patterns like consecutive points near limits or a run of points on one side of the average can indicate instability. - When these conditions arise, it's vital to investigate and identify possible special causes, which may be amendable or need adjustment.

Prompt action during out-of-control conditions prevents defective product production and maintains process efficiency. By constantly monitoring and adjusting the process, businesses can ensure a stable quality output.

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Most popular questions from this chapter

Suppose that a process is in control and an \(\bar{X}\) chart is used with a sample size of 4 to monitor the process. Suddenly there is a mean shift of \(1.5 \sigma .\) (a) If 3 -sigma control limits are used on the \(\bar{X}\) chart, what is the probability that this shift remains undetected for three consecutive samples? (b) If 2 -sigma control limits are in use on the \(\bar{X}\) chart, what is the probability that this shift remains undetected for three consecutive samples? (c) Compare your answers to parts (a) and (b) and explain why they differ. Also, which limits you would recommend using and why?

Suppose that a \(P\) chart with center line at \(\bar{p}\) and \(k\) -sigma control limits is used to control a process. What is the smallest sample size that can be used on this control chart to ensure that the lower control limit is positive?

A control chart for individual observations has 3 -sigma control limits \(U C L=1.80\) and \(L C L=1.62 .\) The process specification limits are (1.64,1.84) . (a) Estimate the process standard deviation. (b) Calculate \(P C R\) and \(P C R_{k}\) for the process.

A article of Epilepsy Research ["Statistical Process Control (SPC): A Simple Objective Method for Monitoring Seizure Frequency and Evaluating Effectiveness of Drug Interventions in Refractory Childhood Epilepsy," (2010, Vol 91, pp. \(205-213\) ) ] used control charts to monitor weekly seizure changes in patients with refractory childhood epilepsy. The following table shows representative data of weekly observations of seizure frequency (SF). $$\begin{array}{lcccccccccc}\hline \text { Week } & 1 & 2 & 3 & 4 & 5 & 6 & 7 & 8 & 9 & 10 \\\\\text { SF } & 13 & 10 & 17 & 10 & 18 & 14 & 10 & 12 & 16 & 13 \\\\\text { Week } & 11 & 12 & 13 & 14 & 15 & 16 & 17 & 18 & 19 & 20 \\\\\text { SF } & 14 & 11 & 8 & 11 & 10 & 3 & 2 & 13 & 15 & 21 \\\\\text { Week } & 21 & 22 & 23 & 24 & 25 & & & & & \\\\\text { SF } & 15 & 12 & 14 & 18 & 12 & & & & & \\\\\hline\end{array}$$ (a) What type of control chart is appropriate for these data? Construct this chart. (b) Comment on the control of the process. (c) If necessary, assume that assignable causes can be found, eliminate suspect points, and revise the control limits. (d) In the publication, the weekly SFs were approximated as normally distributed and an individuals chart was constructed. Construct this chart and compare it to the attribute chart you built in part (a).

The following data from the U.S. Department of Energy Web site (www.eia.doe.gov) reported the total U.S. renewable energy consumption by year (trillion BTU) from 1973 to 2004 $$\begin{array}{lclc}\hline & \text { Total Renewable } & & \text { Total Renewable } \\\& \text { Energy } & & \text { Energy } \\\& \text { Consumption } & & \text { Consumption } \\\\\text { Year } & \text { (Trillion BTU) } & \text { Year } & \text { (Trillion BTU) } \\\\\hline 1973 & 4433.121 & 1989 & 6294.209 \\\1974 & 4769.395 & 1990 & 6132.572 \\\1975 & 4723.494 & 1991 & 6158.087 \\\1976 & 4767.792 & 1992 & 5907.147 \\\1977 & 4249.002 & 1993 & 6155.959 \\\1978 & 5038.938 & 1994 & 6064.779 \\\1979 & 5166.379 & 1995 & 6669.261 \\\1980 & 5494.420 & 1996 & 7136.799 \\\1981 & 5470.574 & 1997 & 7075.152 \\\1982 & 5985.352 & 1998 & 6560.632 \\\1983 & 6487.898 & 1999 & 6598.630 \\ 1984 & 6430.646 & 2000 & 6158.232 \\\1985 & 6032.728 & 2001 & 5328.335 \\\1986 & 6131.542 & 2002 & 5835.339 \\\1987 & 5686.932 & 2003 & 6081.722 \\\1988 & 5488.649 & 2004 &6116.287\end{array}$$ (a) Using all the data, find calculate control limits for a control chart for individual measurements, construct the chart, and plot the data. (b) Do the data appear to be generated from an in-control process? Comment on any patterns on the chart.

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